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Semiconductor Reliability for Automotive and Power System Applications
Dr. Leon M. Tolbert
The reliability of semiconductor devices plays a significant role in the reliability of
the system for both automotive and power system applications. Initially, IGBT devices are
considered for electrical reliability testing and later extended to other devices like
MOSFET, thyristors and GTOs.
The main objective of this project is to develop electrical stress testing methods
similar to the mechanical stress reliability tests. Most of the current life testing
methods have temperature as a major or supplementary stress to validate the life of
semiconductor. Voltage and current stress testing are the predominant testing waveforms
considered for this purpose. On validating the degradation of the semiconductors
with electrical stresses, simulation and mathematical models would be developed.
Related publications and presentations